Citation Formats

MLA

Maguire, Russell. Wafer Defect Microscopy Enhancement Using Perceptually Motivated Super-resolution Convolutional Neural Networks [dataset]. Durham University, 2019.

APA

Maguire, R. (2019). Wafer Defect Microscopy Enhancement using Perceptually Motivated Super-Resolution Convolutional Neural Networks [dataset]. Durham University.

Chicago

Maguire, Russell Wafer Defect Microscopy Enhancement Using Perceptually Motivated Super-Resolution Convolutional Neural Networks [dataset]. Durham University, 2019.