This dataset supports the manuscipt Tokac M., Kinane C.J., Atkinson D., and Hindmarch A.T., 'Temperature dependence of magnetically dead layers in ferromagnetic thin-films'.

A description of the data and file formats is included below.
Please contact Aidan Hindmarch <a.t.hindmarch@durham.ac.uk> with any questions.

Temperature dependent magnetisation is measured using a Quantum Design MPMS SQUID magnetometer. 
X-ray reflectivity is measured using a Rigaku Smartlab diffractometer with a Cu-k-alpha source.
Polarised neutron reflectivity is measured using the CRISP reflectometer instrument at the ISIS pulsed neutron source, Rutherford Appleton Laboratory, UK.

All files are TAB delimited ascii and the header contains the quantity and units for each column containing the data shown in the figure. 
Trendlines, fits and the resulting scattering length density profiles shown in the figures are not included, but can be reproduced from the measured data as described in the manuscript. Schematics, etc. are also not included.


Figure1a.dat contains volume magnetisation (emu/cc) vs temperature (K), measured in an applied field of 100 Oe for the CoFeTaB(10 nm) film on GaAs(001).
Figure1b.dat contains volume magnetisation (emu/cc) vs temperature (K), measured in an applied field of 100 Oe for the CoFeTaB(10 nm) film on oxidised Si(001).

Figure2a.dat contains scattering vector Q_Z (angstrom^-1) dependence of x-ray reflectivity intensity (counts per second) measured at room temperature for the CoFeTaB(10 nm) film on oxidised Si(001).
Figure2b.dat contains scattering vector Q_Z (angstrom^-1) dependence of x-ray reflectivity intensity (counts per second) measured at room temperature for the CoFeTaB(10 nm) film on GaAs(001).

Figure3ab.dat contains scattering vector Q_Z (angstrom^-1) dependence of (normalised) spin up reflectivity (and error bar) and (normalised) spin down reflectivity (and error bar) measured at temperature of 10 K for the CoFeTaB(10 nm) film on oxidised Si(001). The spin asymmetry data in frame b) is derived from the reflectivity data in frame a) as described in the manuscript.
Figure3cd.dat contains scattering vector Q_Z (angstrom^-1) dependence of (normalised) spin up reflectivity (and error bar) and (normalised) spin down reflectivity (and error bar) measured at temperature of 70 K for the CoFeTaB(10 nm) film on oxidised Si(001). The spin asymmetry data in frame d) is derived from the reflectivity data in frame c) as described in the manuscript.
Figure3ef.dat contains scattering vector Q_Z (angstrom^-1) dependence of (normalised) spin up reflectivity (and error bar) and (normalised) spin down reflectivity (and error bar) measured at temperature of 10 K for the CoFeTaB(10 nm) film on GaAs(001). The spin asymmetry data in frame f) is derived from the reflectivity data in frame e) as described in the manuscript.
Figure3gh.dat contains scattering vector Q_Z (angstrom^-1) dependence of (normalised) spin up reflectivity (and error bar) and (normalised) spin down reflectivity (and error bar) measured at temperature of 55 K for the CoFeTaB(10 nm) film on GaAs(001). The spin asymmetry data in frame h) is derived from the reflectivity data in frame g) as described in the manuscript.
