>> Meta Data description for Taylor et al "A comparative study of microstructural stability and sulphurdiffusion in CdS/CdTe photovoltaic devices"

* ‘Images’ folder contains TIFF images of device microstructures acquired using a scanning TEM.

* Sulphur ion-implantation parameters and profiles are summarised in the pdf file ’S_chain_into_CdTe.pdf’

* Thermal history of sample are in 'thermal_history.rtf’ word file

* STEM EDX measurements of the sulphur profiles for different samples are given in the Excel file 'Sulfur_Concentrations.xlsx’

* Raw data for the cathodoluminescence hyperspectral map shown in Fig 7 of the paper is in 'LP147T-XSection-5kV-10ms-4.csv’ text file. This has been converted to a *.dm3 file of the same name for further analysis using Gatan Digital Micrograph proprietary software. Users who do not have access to this software can still view the DM3 file by using 'ImageJ' freeware, which can be downloaded from the web.

Note that the first row represents wavelength [nm] and subsequent rows are counts (apart from the first two entries which are spatial position).

* The CL spectra in Fig 7d are in the text files 'Lp147T-XSection-5kV-10ms-4-CdTe_spectrum.csv’ and 'Lp147T-XSection-5kV-10ms-4-CdSTe_spectrum' respectively.

Note the meaning of some information in the file name:
 - Lp147T refers the SIRE sample (this is how it is referred to in the paper) in the 'treated' condition;
 - Xsection means the device is viewed in cross-section;
 - 5 kV is the voltage of the electron beam;
 - 10ms is the signal acquisition time per pixel;
 - 4 is the '4th' run
 - of CdSTe spectrum.

* CL peak shifts reported in Fig 8 are in the Excel file 'CL_Peak_Shift_Data.xlsx’